Field results from a new die-to-database reticle inspection platform ...
Patterned Wafer Inspection System. Specificatimis ... the system by mmm' ingairhnrnr particles. Physical ... It uses more advanced algorithms and new 486 ... defects and pattern features. For a 25% higher defect capture rate. ' Plus, new signal amplification ... detection limit of the system from 0.5um down to 0.4um. The new.
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Contacts | Job Title | Contacts | Location | Update |
Martin Sczyrba | Senior Member Of Technical Staff |
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Greater Dresden Area | |
Oliver Broermann | Director Production |
|
Dresden, Saxony, Germany | |
Fritz Gans | Director Technical Services At Advanced Mask Technology Center |
|
Dresden | |
Pavel Nesladek | Member Of Technical Staff |
|
Dresden, Saxony, Germany | |
Martin Bloecker | Member Of Technical Staff |
|
Dresden, Saxony, Germany | |
Rusty Cantrell | Senior Process Engineer |
|
Greater Dresden Area | |
Axel Feicke | MTS - Member Technical Staff |
|
Germany | |
Manfred Stiegler | Senior Manager Information Technology |
|
Greater Dresden Area | |
Raphael Moses | Senior Process Engineer |
|
Greater Dresden Area | |
Valentine Baudiquez | Principal Scientist Engineer |
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Meylan, Auvergne-Rhône-Alpes, France | |
Christian Enkrich | Director Global Platform Development |
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Karlsruhe, Baden-Württemberg, Germany | |
André Weber | Automation Engineer |
|
Greater Dresden Area | |
Ralf Taumer | Engineer Assistant |
|
Greater Dresden Area | |
Katja Paul | Automation Engineer At IT MDP (Mask Data Preparation) |
|
Greater Dresden Area | |
Kamran Avary | Process Engineer |
|
Greater Dresden Area |
AMTC Dresden's website is amtc-dresden.com